Freddy Forero, Michel Renovell, Víctor H. Champac. B-open: A New Defect in Nanometer Technologies due to SADP Process. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-2, IEEE, 2019. [doi]
@inproceedings{ForeroRC19, title = {B-open: A New Defect in Nanometer Technologies due to SADP Process}, author = {Freddy Forero and Michel Renovell and Víctor H. Champac}, year = {2019}, doi = {10.1109/ETS.2019.8791524}, url = {https://doi.org/10.1109/ETS.2019.8791524}, researchr = {https://researchr.org/publication/ForeroRC19}, cites = {0}, citedby = {0}, pages = {1-2}, booktitle = {24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019}, publisher = {IEEE}, isbn = {978-1-7281-1173-5}, }