Deep Learning Based Detachment Segmentation: the MIRET Approach

Federico Foria, Mario Calicchio, Gabriele Miceli, Aniello Xie, Davide Cuccato, Alessandro Allegro. Deep Learning Based Detachment Segmentation: the MIRET Approach. In IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2022, Rome, Italy, October 26-28, 2022. pages 422-426, IEEE, 2022. [doi]

Abstract

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