Pierre Formont, Jean Philippe Ovarlez, Frédéric Pascal 0001, Gabriel Vasile, Laurent Ferro-Famil. A test statistic for high resolution polarimetric SAR data classification. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 1871-1874, IEEE, 2010. [doi]
@inproceedings{FormontOPVF10,
title = {A test statistic for high resolution polarimetric SAR data classification},
author = {Pierre Formont and Jean Philippe Ovarlez and Frédéric Pascal 0001 and Gabriel Vasile and Laurent Ferro-Famil},
year = {2010},
doi = {10.1109/IGARSS.2010.5651074},
url = {http://dx.doi.org/10.1109/IGARSS.2010.5651074},
tags = {classification, testing, Pascal},
researchr = {https://researchr.org/publication/FormontOPVF10},
cites = {0},
citedby = {0},
pages = {1871-1874},
booktitle = {IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings},
publisher = {IEEE},
}