Robert L. Franch, Phillip Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, G. Salem. On-chip timing uncertainty measurements on IBM microprocessors. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-7, IEEE, 2007. [doi]
Abstract is missing.