Statistical methodology for modeling non-IID memory fails events

Sabine Francis, Rouwaida Kanj, Rajiv V. Joshi, Ayman I. Kayssi, Ali Chehab. Statistical methodology for modeling non-IID memory fails events. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 205-211, IEEE, 2014. [doi]

Abstract

Abstract is missing.