Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner. Reliability analysis of logic circuits based on signal probability. In 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, St. Julien's, Malta, August 31 2008-September 3, 2008. pages 670-673, IEEE, 2008. [doi]
Abstract is missing.