Olivier François, Philippe Leray. Generation of Incompliete Test-Data usinng Bayesinan Networks. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2007, Celebrating 20 years of neural networks, Orlando, Florida, USA, August 12-17, 2007. pages 2391-2396, IEEE, 2007. [doi]
@inproceedings{FrancoisL07:0,
title = {Generation of Incompliete Test-Data usinng Bayesinan Networks},
author = {Olivier François and Philippe Leray},
year = {2007},
doi = {10.1109/IJCNN.2007.4371332},
url = {http://dx.doi.org/10.1109/IJCNN.2007.4371332},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/FrancoisL07%3A0},
cites = {0},
citedby = {0},
pages = {2391-2396},
booktitle = {Proceedings of the International Joint Conference on Neural Networks, IJCNN 2007, Celebrating 20 years of neural networks, Orlando, Florida, USA, August 12-17, 2007},
publisher = {IEEE},
}