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Qualification procedure for moisture in embedded capacitors

Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp. Qualification procedure for moisture in embedded capacitors. Microelectronics Reliability, 54(9-10):2013-2016, 2014. [doi]

Authors

Hélène Frémont

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Jörg Kludt

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Massar Wade

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Kirsten Weide-Zaage

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Isabelle Bord-Majek

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Geneviève Duchamp

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