Qualification procedure for moisture in embedded capacitors

Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp. Qualification procedure for moisture in embedded capacitors. Microelectronics Reliability, 54(9-10):2013-2016, 2014. [doi]

Abstract

Abstract is missing.