Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications

Charlotte Frenkel, Jean-Didier Legat, David Bol. Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications. In 2016 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016. pages 1-6, IEEE, 2016. [doi]

@inproceedings{FrenkelLB16,
  title = {Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications},
  author = {Charlotte Frenkel and Jean-Didier Legat and David Bol},
  year = {2016},
  doi = {10.1109/VLSI-SoC.2016.7753573},
  url = {http://dx.doi.org/10.1109/VLSI-SoC.2016.7753573},
  researchr = {https://researchr.org/publication/FrenkelLB16},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {2016 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-3561-8},
}