Alexander Frey, Franz Hofmann, R. Peters, Birgit Holzapfl, Meinrad Schienle, Christian Paulus, Petra Schindler-Bauer, Dirk Kuhlmeier, Jürgen Krause, Gerald Eckstein, Roland Thewes. Yield Evaluation of Gold Sensor Electrodes Used for Fully Electronic DNA Detection Arrays on CMOS. Microelectronics Reliability, 42(9-11):1801-1806, 2002. [doi]
Abstract is missing.