Ellen M. Friedman. How to Avoid Disaster in Planning for New Applications: Benchmarking and Modeling as a Solution. In Leo F. Zimmerman, John P. Pilch, Linda J. Carroll, Mark Sorkin, Daniel Kaberon, Doug McBride, Frank M. Bereznay, Dale Doolittle, Joel Goldstein, Dave Thorn, Harry Zimmer, Ellen E. Robertson, Peggy De Rossett, Bernard Domanski, Philip Clark, Robert L. Morrison, Edgar A. Ortiz, editors, 17th International Computer Measurement Group Conference, Nashville, TN, USA, December 9-13, 1991, Proceedings. pages 928-937, Computer Measurement Group, 1991.
Abstract is missing.