13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS - researchr publication authors

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Fabio Frustaci, Mahmood Khayatzadeh, David T. Blaauw, Dennis Sylvester, Massimo Alioto. 13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS. In 2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014. pages 244-245, IEEE, 2014. [doi]

This author has not been identified. Look up 'Fabio Frustaci' in GoogleThis author has not been identified. Look up 'Mahmood Khayatzadeh' in GoogleThis author has not been identified. Look up 'David T. Blaauw' in GoogleThis author has not been identified. Look up 'Dennis Sylvester' in GoogleThis author has not been identified. It may be one of the following persons:

Massimo Alioto

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