Fabio Frustaci, Mahmood Khayatzadeh, David T. Blaauw, Dennis Sylvester, Massimo Alioto. 13.8 A 32kb SRAM for error-free and error-tolerant applications with dynamic energy-quality management in 28nm CMOS. In 2014 IEEE International Conference on Solid-State Circuits Conference, ISSCC 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014. pages 244-245, IEEE, 2014. [doi]
Abstract is missing.