Edward W. S. Fry, Sophie Triantaphillidou, Robin B. Jenkin, Ralph E. Jacobson, John R. Jarvis. Scene-and-Process-Dependent Spatial Image Quality Metrics. In Nicolas Bonnier, Mylène C. Q. Farias, editors, Image Quality and System Performance XVII, Electronic Imaging 2020, IQSP, Burlingame, CA, USA, 26-30 January 2020. Ingenta, 2020. [doi]
@inproceedings{FryTJJJ20b,
title = {Scene-and-Process-Dependent Spatial Image Quality Metrics},
author = {Edward W. S. Fry and Sophie Triantaphillidou and Robin B. Jenkin and Ralph E. Jacobson and John R. Jarvis},
year = {2020},
doi = {10.2352/J.ImagingSci.Technol.2019.63.6.060407},
url = {https://doi.org/10.2352/J.ImagingSci.Technol.2019.63.6.060407},
researchr = {https://researchr.org/publication/FryTJJJ20b},
cites = {0},
citedby = {0},
booktitle = {Image Quality and System Performance XVII, Electronic Imaging 2020, IQSP, Burlingame, CA, USA, 26-30 January 2020},
editor = {Nicolas Bonnier and Mylène C. Q. Farias},
publisher = {Ingenta},
}