Edward W. S. Fry, Sophie Triantaphillidou, Robin B. Jenkin, Ralph E. Jacobson, John R. Jarvis. Scene-and-Process-Dependent Spatial Image Quality Metrics. In Nicolas Bonnier, Mylène C. Q. Farias, editors, Image Quality and System Performance XVII, Electronic Imaging 2020, IQSP, Burlingame, CA, USA, 26-30 January 2020. Ingenta, 2020. [doi]
Abstract is missing.