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Live Demonstration: An Event-Driven E-Skin System with Dynamic Binary Scanning and real time SNN Classification

Zhengnan Fu, Li Gaishan, Anubhab Tripathi, Arindam Basu. Live Demonstration: An Event-Driven E-Skin System with Dynamic Binary Scanning and real time SNN Classification. In IEEE International Symposium on Circuits and Systems, ISCAS 2026, Shanghai, China, May 24-28, 2026. pages 1679, IEEE, 2026. [doi]

Authors

Zhengnan Fu

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Li Gaishan

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Anubhab Tripathi

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Arindam Basu

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