Zhengnan Fu, Li Gaishan, Anubhab Tripathi, Arindam Basu. Live Demonstration: An Event-Driven E-Skin System with Dynamic Binary Scanning and real time SNN Classification. In IEEE International Symposium on Circuits and Systems, ISCAS 2026, Shanghai, China, May 24-28, 2026. pages 1679, IEEE, 2026. [doi]
Abstract is missing.