Xin Fu, Tao Li, José A. B. Fortes. Combined circuit and microarchitecture techniques for effective soft error robustness in SMT processors. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings. pages 137-146, IEEE Computer Society, 2008. [doi]
Abstract is missing.