Weimin Fu, Zelin Lu, Gang Qu 0001, Xiaolong Guo 0001. Control-Flow Collapse: Exploiting Gating Logic in MoE Accelerators via Instruction-Level Fault Injection. In Fan Chen 0001, Peipei Zhou 0001, Jie Gu 0001, Amit Ranjan Trivedi, Xiaoxuan Yang 0001, editors, Proceedings of the Great Lakes Symposium on VLSI 2026, GLSVLSI 2026, Canandaigua, NY, USA, June 22-24, 2026. pages 693-700, ACM, 2026. [doi]
Abstract is missing.