Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips

Qiang Fu, Wai-Shing Luk, Jun Tao, Xuan Zeng, Wei Cai. Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips. IEICE Transactions, 92-A(12):3007-3015, 2009. [doi]

Authors

Qiang Fu

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Wai-Shing Luk

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Jun Tao

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Xuan Zeng

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Wei Cai

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