Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips

Qiang Fu, Wai-Shing Luk, Jun Tao, Xuan Zeng, Wei Cai. Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips. IEICE Transactions, 92-A(12):3007-3015, 2009. [doi]

Abstract

Abstract is missing.