Takumi Fujimori, Minoru Watanabe. Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 91-95, IEEE, 2017. [doi]
@inproceedings{FujimoriW17, title = {Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array}, author = {Takumi Fujimori and Minoru Watanabe}, year = {2017}, doi = {10.1109/SOCC.2017.8226014}, url = {https://doi.org/10.1109/SOCC.2017.8226014}, researchr = {https://researchr.org/publication/FujimoriW17}, cites = {0}, citedby = {0}, pages = {91-95}, booktitle = {30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017}, editor = {Massimo Alioto and Hai Helen Li and Jürgen Becker and Ulf Schlichtmann and Ramalingam Sridhar}, publisher = {IEEE}, isbn = {978-1-5386-4034-0}, }