Kazunori Fujimoto, Jun Muramatsu, Masaaki Nagahara. Dynamical Model of Overconfidence Phenomena Due to ZE-Type Confirmation Bias. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2018, Miyazaki, Japan, October 7-10, 2018. pages 2212-2217, IEEE, 2018. [doi]
Abstract is missing.