Masahiro Fujita. Variation-Aware Analysis and Test Pattern Generation Based on Functional Faults. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 273-277, IEEE, 2014. [doi]
@inproceedings{Fujita14-4,
title = {Variation-Aware Analysis and Test Pattern Generation Based on Functional Faults},
author = {Masahiro Fujita},
year = {2014},
doi = {10.1109/ISVLSI.2014.116},
url = {http://dx.doi.org/10.1109/ISVLSI.2014.116},
researchr = {https://researchr.org/publication/Fujita14-4},
cites = {0},
citedby = {0},
pages = {273-277},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014},
publisher = {IEEE},
}