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An Empirical Study on the Use of Snapshot Testing

Shun Fujita, Yutaro Kashiwa, Bin Lin 0008, Hajimu Iida. An Empirical Study on the Use of Snapshot Testing. In IEEE International Conference on Software Maintenance and Evolution, ICSME 2023, Bogotá, Colombia, October 1-6, 2023. pages 335-340, IEEE, 2023. [doi]

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