Masahiro Fujita, Takeshi Matsumoto, Satoshi Jo. FOF: Functionally Observable Fault and its ATPG techniques. In Martin Margala, Ricardo Augusto da Luz Reis, Alex Orailoglu, Luigi Carro, Luis Miguel Silveira, H. Fatih Ugurdag, editors, 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013. pages 108-111, IEEE, 2013. [doi]
Abstract is missing.