SIFT feature reduction based on feature similarity of repeated patterns - researchr publication authors

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Yoshihiro Fujiwara, Takuya Okamoto, Katsuya Kondo. SIFT feature reduction based on feature similarity of repeated patterns. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2013, Naha-shi, Japan, November 12-15, 2013. pages 311-314, IEEE, 2013. [doi]

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