Yoshihiro Fujiwara, Takuya Okamoto, Katsuya Kondo. SIFT feature reduction based on feature similarity of repeated patterns. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2013, Naha-shi, Japan, November 12-15, 2013. pages 311-314, IEEE, 2013. [doi]
@inproceedings{FujiwaraOK13,
title = {SIFT feature reduction based on feature similarity of repeated patterns},
author = {Yoshihiro Fujiwara and Takuya Okamoto and Katsuya Kondo},
year = {2013},
doi = {10.1109/ISPACS.2013.6704567},
url = {http://dx.doi.org/10.1109/ISPACS.2013.6704567},
researchr = {https://researchr.org/publication/FujiwaraOK13},
cites = {0},
citedby = {0},
pages = {311-314},
booktitle = {International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2013, Naha-shi, Japan, November 12-15, 2013},
publisher = {IEEE},
}