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Improving the reliability of chip-off forensic analysis of NAND flash memory devices

Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu. Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digital Investigation, 20 Supplement, 2017. [doi]

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Aya Fukami

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Saugata Ghose

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Yixin Luo

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Yu Cai

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Onur Mutlu

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