Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu. Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digital Investigation, 20 Supplement, 2017. [doi]
@article{FukamiGLCM17,
title = {Improving the reliability of chip-off forensic analysis of NAND flash memory devices},
author = {Aya Fukami and Saugata Ghose and Yixin Luo and Yu Cai and Onur Mutlu},
year = {2017},
doi = {10.1016/j.diin.2017.01.011},
url = {https://doi.org/10.1016/j.diin.2017.01.011},
researchr = {https://researchr.org/publication/FukamiGLCM17},
cites = {0},
citedby = {0},
journal = {Digital Investigation},
volume = {20 Supplement},
}