Shinji Fukuma, Yoshiro Iwai, Shin-ichiro Mori. i-MSE: A Fine Structure Imaging for Surface and Its Inside of Solid Material with Micro Slurry-Jet Erosion Test. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 106(11):1376-1384, November 2023. [doi]
Abstract is missing.