Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima. Test generation systems in Japan. In Robert B. Hitchcock Sr., Donald J. Humcke, Stephen A. Szygenda, editors, Proceedings of the 12th Design Automation Conference, DAC '75, Boston, Massachusetts, USA, June 23-25, 1975. pages 114-122, ACM, 1975. [doi]
Abstract is missing.