A comparison between IEM-based surface bistatic scattering models - researchr publication authors

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Adrian K. Fung, W. Y. Liu, Kun-Shan Chen. A comparison between IEM-based surface bistatic scattering models. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2002, Toronto, Ontario, Canada, 24-28 June 2002. pages 441-443, IEEE, 2002. [doi]

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