Adrian K. Fung, W. Y. Liu, Kun-Shan Chen. A comparison between IEM-based surface bistatic scattering models. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2002, Toronto, Ontario, Canada, 24-28 June 2002. pages 441-443, IEEE, 2002. [doi]
@inproceedings{FungLC02,
title = {A comparison between IEM-based surface bistatic scattering models},
author = {Adrian K. Fung and W. Y. Liu and Kun-Shan Chen},
year = {2002},
doi = {10.1109/IGARSS.2002.1025066},
url = {https://doi.org/10.1109/IGARSS.2002.1025066},
researchr = {https://researchr.org/publication/FungLC02},
cites = {0},
citedby = {0},
pages = {441-443},
booktitle = {IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2002, Toronto, Ontario, Canada, 24-28 June 2002},
publisher = {IEEE},
isbn = {0-7803-7536-X},
}