Jun Furuta, C. Hamanaka, K. Kobayashi, Hidetoshi Onodera. A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 83-84, IEEE, 2011. [doi]
Abstract is missing.