Kiyoshi Furuya, Susumu Yamazaki, Masayuki Sato. Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. IEICE Transactions, 78-D(7):889-894, 1995. [doi]
@article{FuruyaYS95,
title = {Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing},
author = {Kiyoshi Furuya and Susumu Yamazaki and Masayuki Sato},
year = {1995},
url = {http://search.ieice.org/bin/summary.php?id=e78-d_7_889},
tags = {testing, source-to-source, open-source},
researchr = {https://researchr.org/publication/FuruyaYS95},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {78-D},
number = {7},
pages = {889-894},
}