Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing

Kiyoshi Furuya, Susumu Yamazaki, Masayuki Sato. Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. IEICE Transactions, 78-D(7):889-894, 1995. [doi]

Abstract

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