Phillip Fynan, Zeye Dexter Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton. Logic characterization vehicle design reflection via layout rewiring. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
Abstract is missing.