Naive Bayesian Classifiers with Extreme Probability Features

Linda C. van der Gaag, Andrea Capotorti. Naive Bayesian Classifiers with Extreme Probability Features. In Milan Studený, Václav Kratochvíl, editors, International Conference on Probabilistic Graphical Models, PGM 2018, 11-14 September 2018, Prague, Czech Republic. Volume 72 of Proceedings of Machine Learning Research, pages 499-510, PMLR, 2018. [doi]

Abstract

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