Improved automatic exposure control using morphology-based disturbance recognition

Rolf Gaasbeek, Rick van der Maas, Mark den Hartog, Bram De Jager. Improved automatic exposure control using morphology-based disturbance recognition. In IEEE 11th International Symposium on Biomedical Imaging, ISBI 2014, April 29 - May 2, 2014, Beijing, Chin, Beijing, China. pages 1271-1274, IEEE, 2014. [doi]

Authors

Rolf Gaasbeek

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Rick van der Maas

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Mark den Hartog

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Bram De Jager

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