Prasad Gabbur, Sharath Pankanti, Quanfu Fan, Hoang Trinh. A pattern discovery approach to retail fraud detection. In Chid Apté, Joydeep Ghosh, Padhraic Smyth, editors, Proceedings of the 17th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Diego, CA, USA, August 21-24, 2011. pages 307-315, ACM, 2011. [doi]
Abstract is missing.