Takwa Ben Aïcha Gader, Afef Kacem Echi. Deep Layout Analysis of Multi-lingual and Composite Documents. In Akram Bennour, Ahmed Bouridane, Lotfi Chaâri, editors, Intelligent Systems and Pattern Recognition - Third International Conference, ISPR 2023, Hammamet, Tunisia, May 11-13, 2023, Revised Selected Papers, Part I. Volume 1940 of Communications in Computer and Information Science, pages 76-89, Springer, 2023. [doi]
Abstract is missing.