Xavier Gagnard, Yannick Rey-Tauriac, Olivier Bonnaud. Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology. Microelectronics Reliability, 41(9-10):1335-1340, 2001.
@article{GagnardRB01,
title = {Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology},
author = {Xavier Gagnard and Yannick Rey-Tauriac and Olivier Bonnaud},
year = {2001},
tags = {optimization},
researchr = {https://researchr.org/publication/GagnardRB01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1335-1340},
}