Bojana Gajic, Ariel Amato, Ramon Baldrich, Joost van de Weijer 0001, Carlo Gatta. Area Under the ROC Curve Maximization for Metric Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2022, New Orleans, LA, USA, June 19-20, 2022. pages 2806-2815, IEEE, 2022. [doi]
Abstract is missing.