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Rajesh Galivanche, Rohit Kapur, Antonio Rubio. Testing in the year 2020. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 960-965, ACM, 2007. [doi]

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