Daniele Gallo, Carmine Landi, Roberto Langella, Mario Luiso, Alfredo Testa, N. Watson. On the Measurement of Power Electronic Devices' Frequency Coupling Admittance. In IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2017, Liverpool, United Kingdom, September 20-22, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.