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A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance

Daniele Gallo, Roberto Langella, Mario Luiso, Alfredo Testa, Neville R. Watson. A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance. IEEE T. Instrumentation and Measurement, 67(10):2401-2409, 2018. [doi]

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Daniele Gallo

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Roberto Langella

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Mario Luiso

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Alfredo Testa

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Neville R. Watson

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