Daniele Gallo, Roberto Langella, Mario Luiso, Alfredo Testa, Neville R. Watson. A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance. IEEE T. Instrumentation and Measurement, 67(10):2401-2409, 2018. [doi]
@article{GalloLLTW18,
title = {A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance},
author = {Daniele Gallo and Roberto Langella and Mario Luiso and Alfredo Testa and Neville R. Watson},
year = {2018},
doi = {10.1109/TIM.2018.2819318},
url = {https://doi.org/10.1109/TIM.2018.2819318},
researchr = {https://researchr.org/publication/GalloLLTW18},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {67},
number = {10},
pages = {2401-2409},
}