Manuel Le Gallo, Tomas Tuma, Federico Zipoli, Abu Sebastian, Evangelos Eleftheriou. Inherent stochasticity in phase-change memory devices. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 373-376, IEEE, 2016. [doi]
@inproceedings{GalloTZSE16,
title = {Inherent stochasticity in phase-change memory devices},
author = {Manuel Le Gallo and Tomas Tuma and Federico Zipoli and Abu Sebastian and Evangelos Eleftheriou},
year = {2016},
doi = {10.1109/ESSDERC.2016.7599664},
url = {http://dx.doi.org/10.1109/ESSDERC.2016.7599664},
researchr = {https://researchr.org/publication/GalloTZSE16},
cites = {0},
citedby = {0},
pages = {373-376},
booktitle = {46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2969-3},
}